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    AXIS Supra+ : XPS surface analysis instrument

    The AXIS Supra+ combines state-of-the-art XPS performance with unrivalled automation and ease of use.  This instrument excels in both spectroscopy and imaging modes and has the flexibility to incorporate complementary surface analytical techniques and surface modification accessories.

    AXIS Supra+
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    Gas Cluster Ion Source (GCIS) : Minibeam 6

    This is a 20 keV, multi-mode Gas Cluster Ion Source is designed to operate in both Arn+ cluster and Ar+ monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and metallic thin films.

     

    GCIS : Minibeam 6
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    ESCApe data system

    ESCApe data system is a single, easy to use, package for instrument control, data acquisition and data processing. With a user-friendly interface and advanced features, our software streamlines the analytical process, saving you time and maximising efficiency. It’s the latest generation of software for use with AXIS Supra+ and AXIS Nova photoelectron spectrometers.

    ESCApe data system