X-ray photoelectron spectroscopy (XPS) is ideally suited to provide information relating to interfacial material properties that are critical to the performance of modern batteries.  It can give insights into chemical composition, elemental or chemical distribution of species, defect sites or functional groups.  Importantly, AXIS spectrometers allow studies of these materials to be extended to in-situ and in-operando characterisation of model devices.

Recently ionic liquids have attracted the attention of a growing number of surface scientists interested in exploring the interactions at the both the liquid/gas and liquid/solid interfaces.

Spectromicroscopy, also referred to as spectra from images, provides the ability to generate quantitative XPS data from a series of images with the unique advantage that spectra may be generated from areas as small as a single pixel. This type of sample analysis is only possible due to the combination of high lateral imaging and very good energy resolution with the pulse counting, two-dimensional delay-line detector (DLD).